Polymer Insulator Processing‐Organic Transistor Performance Relationship Investigated through Admittance Spectroscopy

Admittance spectroscopy is employed to explain the property differences observe between organic thin film transistors (OTFTs) fabricated with various gate insulator layers based on poly(4-vinylphenol) (PVP) and poly(methyl methacrylate) (PMMA). The objective achieved through development of an equivalent circuit a compact analytical model device core structure, namely, metal–insulator–semiconductor (MIS) capacitor. fitting experimental data allows extract wide range parameters and, in particular, demonstrates critical role played by interface semiconductor layers.